Anderson Materials Evaluation, Inc.

Anderson Materials Evaluation, Inc.

8990 Route 108, Suite C-2, Columbia, MD 21045
Ph: (410) 740-8562    Toll Free: (866) 350-8882
Fax: (410) 740-8201    Email: contactus@andersonmaterials.com
| Home | About Us | Services | Applications | Test Methods | Submit Job | Customers | Links |

Surface Roughness

Example 1: The surface roughness (Ra) of a metallic film on a silicon wafer is 0.004 μm

Zygo Surface Roughness Example

In the upper left image, the height is color-coded. The Ra surface roughness value along the horizontal line shown is 0.003 μm, with the height along that line shown in the lower left image. The Ra surface roughness in the entire 0.09mm x 0.06mm area examined is 0.004 μm. The 3-dimensional plot of the image in the upper right displays the sample height directly.


Example 2: The surface roughness (Ra) of a metallic film on a silicon wafer is 0.011 μm

Zygo Surface Roughness Example


Example 3: The surface roughness (Ra) of a metallic film on a silicon wafer is 0.077 μm

Zygo Surface Roughness Example
Top of Page
<<Back to Profilometry
<<Back to Services
Anderson Materials Evaluation, Inc.  |  AME, Inc. Site Map
Maintained by Akhil Rao, Luminous Media
Direct questions and comments to contactus@andersonmaterials.com
© Copyright: 2006 - 2008    Last Revised: Thursday, 25 October 2007