Anderson Materials Evaluation, Inc.

Anderson Materials Evaluation, Inc.

8990 Route 108, Suite C-2, Columbia, MD 21045
Ph: (410) 740-8562    Toll Free: (866) 350-8882
Fax: (410) 740-8201    Email: contactus@andersonmaterials.com
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Step Height Measurement for Thin Film or Coating Thickness

Metallization Films on Silicon Wafers

Example 1: The step height is 2.5 μm, so the film thickness is 2.5 μm

Zygo Step Height Measurement Example



Example 2: The step height is again 2.5 μm in another area of the wafer

Zygo Step Height Measurement Example
Also see: Thin Film Analysis

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