Anderson Materials Evaluation, Inc. provides tests for detecting and identifying silicone and other contaminants in facilities. We provide our own qualified as silicone-free test kits for the ultra-sensitive measurement of silicone contamination in your facility by means of a XPS analysis detection method. This test method also allows the determination of the silicone concentration relative to known concentrations causing significant adhesive bonding degradation. It distinguishes sources of the element silicon as those due to each of the following:
- Silica or glass
- Diphenyl siloxane
- Long chain length dimethyl siloxane (such as in sealants or electronics encapsulants)
- Medium chain length dimethyl siloxane (such as in pressure-sensitive adhesives)
- Short chain length dimethyl siloxane (such as in lubricant or mold release agents)
- Silane coupling agents
The short chain dimethyl siloxanes are usually the cause of airborne silicone contamination and are more harmful to adhesive bond strength when they contaminate an adhesive bondline.
This test kit can also be used to measure fluorocarbon contamination of surfaces or airborne fluorocarbon contamination. Tests for some nitrogen organic contaminants are also possible with this test kit.
Should you require testing instead by a Soxhlet method such as those procedures often based on Rohr testing methods, we can also provide that with some improvements to make the method somewhat more quantitative. Nonetheless, the method is usually poor for detecting the small concentrations of silicones often responsible for airborne silicone contamination and it offers little identification of the silicone in comparison to our XPS test method.