- Small-Spot X-ray Photoelectron Spectroscopy (XPS or ESCA) with Depth Profiling, Heating, & RGA MS
- Scanning Auger Microprobe(SAM)
- Infrared Spectroscopy (FTIR) with Golden Gate ATR for most materials and Veemax II variable-angle specular reflectance for enhanced surface sensitivity
- Scanning Electron Microscopy (SEM) with Digital Imaging, Robinson Backscatter Electron Imaging, and Energy-Dispersive X-ray (EDX) spectroscopy
- 3D Imaging Surface Structure and Profilometry Analysis (Scanning White Light Interference Microscopy)
- Metallographic Optical Microscopy
- Thermal Anaylsis [Differential Scanning Calorimetry (DSC), Thermogravimetry (TG or TGA), and Thermomechanical Analysis (TMA) or dilatometry]
- Electrochemical Evaluations (potentiostatic, galvanostatic, potentiodynamic polarization, and EIS) and Corrosion Testing
- Coating and Film Thickness Measurements by profilometry, SEM, optical microscopy, XPS depth profile, eddy current, and magnetic probe meters
- Cross Section Analysis
- CO2 snow jet, Plasma (Microwave, Oxygen, or Hydrogen), UV, and Solvent Cleaning and Effectiveness Analysis
- X-ray Diffraction (XRD)
- Profilometry: Step Height Measurement and Surface Structure including Surface Roughness Measurements
- Viscometry
- Consulting
- Experimental Design
- Expert Witness
- Failure Analysis and Forensic Engineering
- Quality Control and Assurance
- Research and Development
- Specimen Preparation
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