Our Team

Staff Scientists

Charles R. Anderson, PhD. Materials Physics, Surface Chemistry, XPS, Thin Films, Adhesive Failure Analysis, Corrosion, Coatings, Microscopy, Thermal Analysis (DSC, TGA, TMA), RGA MS, FTIR, Contamination, Static Coefficient of Friction
Lorrie A. Krebs, PhD. Electrochemistry, Corrosion, Microscopy, SEM/EDX, Coating Properties, Failure Analysis, Metallography, Fractography, Cross Section Analysis, Weld Examination
Kevin A. Wepasnick, PhD. Surface Chemistry, Solution Chemistry, Collodial Science, Nanotechnology, XPS, Thermal Analysis (TGA, DSC, TMA), SEM/EDX, Microscopy, FTIR, RGA MS

Charles R. Anderson, PhD, President & Principal Scientist

Materials Physics, Surface Chemistry, XPS, Thin Films, Adhesive Failure Analysis, Corrosion, Coatings, Microscopy, Thermal Analysis (DSC, TGA, TMA, RGA MS, FTIR, Contamination, Static Coefficient of Friction

Dr. Anderson is the founder of AME and the majority owner of the company. Dr. Anderson has long specialized in the characterization of surfaces, interfaces, thin films, and coatings. He began applying surface analysis techniques to the solution of materials problems in 1972.  He has had a wealth of experience with surface chemical phase identifications, corrosion, battery development, adhesive failures, contamination, electronic packaging, thin film and bulk materials composition, composite interfaces, particle and sintered ceramic surfaces, surface oxidation and degradation, and many other applications of surface analysis. He has served as an officer of the ASTM Committee E-42 on Surface Analysis and as a U.S. Expert on several subcommittees of the ISO Technical Committee 201 on Surface Chemical Analysis. He held positions at Case Western Reserve University as a post-doctoral fellow, the Dept. of the Navy as a research physicist, and Martin Marietta and Lockheed Martin as a senior scientist before founding AME, Inc. in 1995. Dr. Anderson especially enjoys integrating the results of multiple analytic techniques to solve tough materials problems. He has assembled a team of materials scientists and engineers with complementary skills and experience who enjoy working together to solve challenging problems. He is or has been a member of AVS, ASM, MRS, ASTM, the Electrochemical Society, ACS, APS, and SAMPE.  He constantly migrates across the boundaries of physics, chemistry, biology, and the engineering disciplines to solve real-world materials problems.  He has considerable experience as an expert witness.

Contact: charles.anderson@andersonmaterials.com

Lorrie A. Krebs, PhD, Vice President & Senior Scientist
Electrochemistry, Corrosion, Microscopy, SEM/EDX, Coating Properties, Failure Analysis, Metallography, Fractography, Cross Section Analysis, Weld Examination

Dr. Krebs joined AME in early 2002 and is a co-owner of the company. Dr. Krebs specializes in corrosion and degradation issues. She is experienced in materials testing and selection for corrosion mitigation in engineering applications, and in the evaluation of novel coating systems using a variety of testing procedures, and in corrosion-related failure analysis. Lorrie has developed new electrochemical testing techniques for AME, including potentiodynamic, potentiostatic, and galvanostatic measurement capabilities. She commonly combines electrochemical analysis with other analytical techniques, in order to determine a more complete picture of corrosion, degradation, and other failure-related phenomena. Dr. Krebs received her doctorate from Johns Hopkins University and has worked as an Army Research Laboratory Fellow.  In earlier work she was involved in the development of patented in-situ corrosion sensor technology based on EIS techniques. Dr. Krebs has been recognized as an expert in her field.  She was appointed principal investigator for a National Science Foundation Phase I SBIR program investigating Electrochemical Brush Patination, a repair technique for patina on outdoor art objects, and has served as the NACE (International Corrosion Society) Annual Conference Program Committee Chair for the 2011 symposium in Houston and the 2012 symposium in Salt Lake City. She continues to be active in NACE as a leader in the Corrosion Mechanisms technical committee.  She has served as an expert witness in a number of legal cases.  In addition to her work at AME, Dr. Krebs has served as an Adjunct Professor in the Department of Chemistry and Physical Sciences at Villa Julie College, now Stevenson University.  She continues to participate at local educational institutions by giving corrosion and materials-related guest lectures at the High School, Undergraduate, and Graduate school levels.

Contact: lorrie.krebs@andersonmaterials.com

Kevin A. Wepasnick, PhD, Scientist & Project Manager
Surface Chemistry, Solution Chemistry, Collodial Science, Nanotechnology, XPS, Thermal Analysis (TGA, DSC, TMA), SEM/EDX, Microscopy, FTIR, RGA MS

Dr. Wepasnick had academic experience working with a wide range of materials including biomedical materials, metal and metal oxide particles, self-assembled monolayers, CVD process films, and nanoparticles of various phases and compositions. Dr. Wepasnick joined the staff of AME in 2011 after completing his Ph.D. dissertation work at Johns Hopkins University (JHU) in surface chemistry. There, he focused his research on the surface analysis of functionalized and modified carbonaceous nanomaterials and metal nanoparticles. Primarily tasked with understanding the chemical effects of oxidants on carbon nanotubes, he worked on derivatization methods to label specific functional groups on their surfaces to improve quantitative x-ray photoelectron spectroscopy (XPS) analysis of oxidation effects. Beyond XPS, Dr. Wepasnick applied a wide range of characterization techniques to explore the surface chemical and morphological effects of oxidation, including FTIR, TEM, Raman, Auger, AFM, and STM. He also was responsible for running and maintaining the Johns Hopkins surface analysis laboratory. In this capacity, he interfaced with over twenty independent research groups from industry, other universities, and JHU organizations including the John Hopkins Applied Physics Laboratory and Johns Hopkins Medical. He enjoys using a multitude of analytical techniques to characterize materials and to solve materials problems.  He manages most projects utilizing FTIR, thermal analysis (TGA, DSC, TMA), and UV/Vis spectroscopy, as well as some projects utilizing XPS and SEM/EDX analyses.  Kevin is now characterizing polymers, organic materials, composite materials, sensor materials, and solving many other materials problems.

Contact: kevinw@andersonmaterials.com

Consultants

Francis C. Burns, PhD. Physical Chemistry, Surface Science, Polymer Failure Analysis, Interfaces, XPS, FTIR, SEM/EDX
John Murray, PhD. Industrial Corrosion, Electrochemical Impedance Spectroscopy (EIS)
Nancy L. Swanson, PhD. Optical Scattering, Particle Sizing
Antonio Martinez, PhD. XRD
Tim Topoleski, PhD. Mechanical Properties, Wear, Fatigue, Surface Preparation, Medical Devices, Knee and Hip Explant Analysis, Bone Properties
Paul Cohen, MS. Metallurgical Failure Analysis, Metallography

Francis C. Burns, PhD
Physical Chemistry, Surface Science, Polymer Failure Analysis, Interfaces, XPS, FTIR, SEM/EDX

Dr. Burns is a physical chemist with expertise in spectroscopy, microscopy, surface science, adhesion, interfaces, and failure analysis (particularly of interfaces). He received his Ph.D. from the University of Wisconsin – Madison. At Wisconsin, he did his thesis work on the electronic structure of silicon containing organic-transition metal complexes using molecular quantum mechanics and gas phase UV photoelectron spectroscopy. After graduate school, he held a postdoctoral position at IBM’s San Jose (now Almaden) research lab. At San Jose, he studied the bonding of long chain fatty acids to metal and metal oxide surfaces using x-ray photoelectron spectroscopy (XPS) and Fourier transform infra-red (FTIR) spectroscopy. Upon completion of his post doctoral work, he moved to IBM’s Endicott, NY facility, where he developed analytical techniques involving spectroscopy (FTIR and UV-Vis) and wet chemical methods for inspection of incoming materials. While at Endicott, he entered the field of laser processing of materials, which he stayed in until he arrived at Hewlett Packard’s research lab for ink jet technology in Corvallis, OR. At Corvallis, he used his expertise in XPS, micro-FTIR, optical microscopy, laser scanning microscopy, and scanning electron microscopy/energy dispersive x-ray analysis in performing failure analysis on thermal ink jet pens. The failure analysis involved contaminant identification and elimination, interface (polymer-polymer and polymer-metal) failures, and the effect of various chemical environments on adhesion. In July 2007, Dr. Burns joined AME to further pursue his interest in surface science, spectroscopy, and microscopy.  In September 2008, he moved to New Hampshire to take a position pursuing his interests in lasers.

John Murray, PhD
Industrial Corrosion, Electrochemical Impedance Spectroscopy (EIS)

Dr. Murray, a NACE Fellow, has over 40 years of basic and applied electrochemistry experience. He worked for Allis-Chalmers Mfg. Co. and Teledyne Corp. on fuel cell, battery, and high purity hydrogen gas production R & D efforts. For many years he worked with the then new technique of gas/liquid chromatography as a research chemist. His Ph.D. thesis in Material Science and Engineering from the Johns Hopkins University was on the use of Electrochemical Impedance Spectroscopy (EIS) to perform in-situ evaluations of the soil corrosion of coated pipeline materials and completed in 1988. From 1989 until 1999, he worked for the Carderock Division of the Naval Surface Warfare Center on many applied corrosion problems and longer term development programs on indium-activated aluminum alloy sacrificial anodes and U. S. Navy paint degradation characterizations. Dr. Murray has developed and taught short courses on corrosion, including a one-day section on EIS evaluations of painted metals and corrosion problems, at the Pennsylvania State University. He has also taught a one-semester continuing education course in Industrial Electrochemistry at the Johns Hopkins University. He now serves as an active consultant through his company Murray’s et al.

Nancy L. Swanson, PhD
Optical Scattering, Particle Sizing

Dr. Swanson is an optical physicist with particular expertise in radiative transport and the Mie theory of optical scattering. Applications to particle sizing and micro- and nano-particle purity are a special interest. She has authored over 30 scientific publications, holds three patents, and has a patent pending. Dr. Swanson worked for the Department of the Navy at both the Coastal Systems Center in Panama City, FL and the Naval Surface Warface Center in Dahlgren, VA for 11 years. She is now a Research Associate in the Physics Department at Western Washington University. She also owns Abacus Enterprises, a firm offering consulting services in the physics and engineering of optical systems.

Antonio Martinez, PhD
X-Ray Diffraction (XRD)

Materials physicist specializing in the determination of surface and film characteristics by advanced x-ray diffraction techniques. He is an expert in the identification of chemical phases, high resolution thin film diffractometry, reflectrometry for multi-layered thin film structure analysis, and strain and texture characterizations. He was previously a research physicist at the Naval Surface Warfare Center, White Oak, and is now the Director of the XRD Facility at the Materials Characterization Center of the University of Puerto Rico.

Tim Topoleski, PhD
Mechanical Properties, Wear, Fatigue, Surface Preparation, Medical Devices

Dr. Topoleski’s expertise is in the mechanics of materials, from both a mechanical engineering and a materials science approach. Most of his work is in bioengineering research.  He has extensive background in materials property testing, including fatigue and fracture properties, and surface preparation of metals, ceramics, and polymers. He also has considerable experience in materials failure analysis, scanning electron microscopy, and surface roughness and wear analysis. He has served as a consultant for forensic medical device failure, as a consultant to the FDA on medical device and materials testing, and as an FDA panel member for the approval of new devices. Dr. Topoleski is a Professor in the Department of Mechanical Engineering at UMBC and has won teaching excellence recognition.

Paul Cohen, MS
Metallurgical Failure Analysis, Metallography

Metallurgical engineer with major interests in materials evaluation and the failure analysis of metallic and non-metallic materials. Mr. Cohen has extensive expertise in SEM/EDS and metallographic microscopy investigations, particularly for the automotive, power, electronics, and defense industries. In addition, he has experience with non-destructive evaluation techniques such as ultrasonic, liquid penetrant, magnetic particle, and eddy current testing. He is a Fellow Engineer in materials engineering with Northrop Grumman Corporation, Electronic Systems.